HP 3070 Pay-Per-Use combinational board test systems

HP 3070 Pay-Per-Use Test Systems: Low entry price with "on demand" access to all HP 3070 test features.

With the HP 3070 Pay-Per-Use (PPU) test systems, you have instant access to all of the test features of the HP 3070 board test system family with only the capital investment of a low-cost process test system. You only pay for the advanced test features when you use them. This gives you maximum flexibility with reduced financial risk.

The HP 3070 Pay-Per-Use systems provide pay-as-you-go test flexibility in three dimensions:

• Test capabilities
• Test speed
• Number of nodes

Standard Testing Capability:

• HP TestJet technology^* for reliable detection of SMT opens with accurate pin-level diagnostics.

• Industry-leading test throughput

• HP MagicTest technology for testing analog components in the absence of 100% electrical probe access.
• Precision 6-wire analog in-circuit testing

• Comprehensive, automatically generated tests for a wide variety of devices:

  shorts	resistors	capacitors	inductors
  parallel R&C	parallel R&L	diodes	zener diodes
  transistors	FETS	potentiometers	fuses
  jumpers	resistor packs	SSI	MSI
  LSI	VLSI	custom ICs	custom mixed ICs
  connectors	sockets	switches	custom analog ICs
  op amps	comparators	voltage regs	voltage refs
  currentsources	opto-isolators	clocks	RS-232 transceivers
  delay lines

• Simultaneous testing of up to 4 boards with HP Throughput Multiplier

• Expandable to 5184 nodes

• Graphical, menu-driven programming environment

• HP VEE test software and VXI test instruments

• Built-in CAD translation software

• Built-in testability analysis software

• Built-in quality statistics software

• Built-in panel testing software

Pay-Per-Use Testing Capability:

• Advanced, high-speed digital in-circuit testing

• >8500 device test libraries

• Digital functional testing

• Timing, backtrace, fault dictionaries

• High speed clocks and pattern rates

• In-circuit Boundary-scan test

• Analog functional test

• Flash RAM programming

• Serial test

• POTS testing

* HP TestJet technology is protected under U.S. patent number 5,254,953.

Unpowered Testing

Maximum System Capacity: 5184 circuit nodes
Opens Testing: Circuit opens detected with HP TestJet Technology.
Shorts Testing: Automatic test with programmable threshold.
Analog Component Testing: 
Resistance, capacitance and inductance.
Polarity verification on polarized SMT and axial capacitors.
Special tests for diodes, zener diodes, transistors, FETs, 
fuses, jumpers, switches and potentiometers.


Powered Testing
Digital Component Testing:
Library-based digital in-circuit component testing.
5184 hybrid nodes maximum
Pattern rate:  Up to 20 million per second
Timing sets
Backtrace
Fault dictionaries
625 kHz to 20 MHz clocks
Flash RAM programming capability
Analog Functional Testing:
Library and user-developed testing of Op-amps, comparators, voltage
regulators, etc.
Communications Testing:
Serial test
POTS test
ISDN test

HP 3170	    Series 3 Pay-Per-Use Test System, 2592 nodes maximum
HP 3070	    Series 3 Pay-Per-Use Test System, 5184 nodes maximum

No literature is available online at this time.

To help you make the right instrument choices

Your Field Sales Engineer is ready to answer your questions about specifications, applications and ordering. Find your Field Sales Engineer at your Local Sales Office.

Related Information:

HP 3072 Series 3 process test system, 5184-Nodes The HP 307 Series 3 process test system provides in-circuit capabilities at the lowest cost while providing rapid time-to-market, and innovative solutions for limited test access.

HP 3073 Series 3 low-cost combinational board test system, 5184-Nodes The HP 3073 Series 3 combinational board test system provides high test throughput and fast time-to-market, and offers innovative solutions for limited test access.

HP 3075 Series 3 high-performance combinational board test system, 5184 nodes The HP 3075 Series 3 high-performance combinational board test system provides the highest test throughput, fast time-to-market, and offers innovative solutions for limited test access.

HP 3079CT Series 3 High-Performance Combinational Communications Board Test System

HP 3172 Series 3 process test system, 2592-Nodes The HP 3172 Series 3 process test system provides in-circuit test capabilities at the lowest cost, while giving you quick time-to-market and innovative solutions for limited test access.

HP 3173 Series 3 low-cost combinational board test system, 2592-Nodes The HP 3173 Series 3 combinational board test system provides the highest test throughput and fast time-to-market, and offers innovative solutions for limited test access.

HP 3175 Series 3 high-performance combinational board test system, 2592-Nodes The HP 3175 Series 3 high-performance combinational board test system provides the highest test throughput and fast time-to-market, and offers innovative solutions for limited test access.

HP 3179CT Series 3 Combinational Communications Board Test System The HP 3179CT combinational communications test system provides high throughput, short test development and high flexibility for today's wired access loop electronics products.

HP 3272 Series 3 process test system, 1296-nodes The HP 3272 Series 3 process test system provides in-circuit capabilities at a low cost, in a small footprint, giving you quick time-to-market and innovative solutions for limited test access.

HP 3273 Series 3 low-cost combinational board test system, 1296-Nodes The HP 3273 Series 3 combinational board test system provides high test throughput and fast time-to-market, and offers innovative solutions for limited test access.

HP 3275 Series 3 high-performance combinational board test system, 1296-Nodes The HP 3275 Series 3 high-performance combinational board test system provides high throughput and fast time-to-market in a small-footprint, with innovative solutions for limited test access.

HP 3279CT Series 3 Combinational Communications Board Test System The HP 3279CT combinational communications test system combines a small-footprint with fast throughput, short test development times and high flexibility for todays wired access loop products.

Related Datasheets for HP 3070 Series 3 Family product datasheets:

HP 3070 Pay-Per-Use combinational board test systems
HP 3072 Series 3 process test system, 5184-Nodes
HP 3073 Series 3 low-cost combinational board test system, 5184-Nodes
HP 3075 Series 3 high-performance combinational board test system, 5184 nodes
HP 3079CT Series 3 High-Performance Combinational Communications Board Test System
HP 3172 Series 3 process test system, 2592-Nodes
HP 3173 Series 3 low-cost combinational board test system, 2592-Nodes
HP 3175 Series 3 high-performance combinational board test system, 2592-Nodes
HP 3179CT Series 3 Combinational Communications Board Test System
HP 3272 Series 3 process test system, 1296-nodes
HP 3273 Series 3 low-cost combinational board test system, 1296-Nodes
HP 3275 Series 3 high-performance combinational board test system, 1296-Nodes
HP 3279CT Series 3 Combinational Communications Board Test System

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