HP 3073 Series 3 low-cost combinational board test system, 5184-Nodes

[ Summary ][ Features ][ Specifications ][ Key Literature ][ Ordering ][ Assistance ][ Related ]

HP 3073 Series 3 low-cost combinational board test system: large boards, small boards, one affordable system

The HP 3073 Series 3 is the most flexible in-circuit board test system from HP. The HP 3073 can handle large, complex boards with thousands of nodes, mixed-signal components and hybrid technologies. When you are running smaller boards, you can put its extra power to use with HP Throughput Multiplier software that allows up to four boards to be tested and programmed simultaneously.

HP provides the flexibility to use the innovative HP Dynamic Access Test suite, an automated toolset for developing test programs, to test boards with BGAs, CSPs, flip chips and other emerging technologies. Designed specifically for boards with limited access to microscopic components, this test suite preserves nodal access in a shrinking world.

The HP 3073 also supports boundary scan hardware and software, flash RAM programming, automatic short-wire fixturing software, and other tools to accelerate test generation and debug. HP TestJet* technology is a method for reliably detecting SMT opens. HP TestJet requries no programming and no debug adjustments. HP TestJet* technology is a method for reliably detecting SMT opens. Implementing HP TestJet technology requires no programming and no debug adjustments.


[ Summary ][ Features ][ Specifications ][ Key Literature ][ Ordering ][ Assistance ][ Related ]

shortsresistorscapacitorsinductors
parallel R&Cparallel R&Ldiodeszener diodes
transistorsFETSpotentiometersfuses
jumpersresistor packsSSIMSI
LSIVLSIcustom ICscustom mixed ICs
connectorssocketsswitchescustom analog ICs
op ampscomparatorsvoltage regsvoltage refs
current sourcesopto-isolatorsclocksRS-232 transceivers
delay lines

FAST AND FRIENDLY SOFTWARE TOOLS

EXTRA PERFORMANCE DIGITAL TESTING


[ Summary ][ Features ][ Specifications ][ Key Literature ][ Ordering ][ Assistance ][ Related ]

Unpowered Testing

Maximum System Capacity: 5184 hybrid nodes Opens Testing: Circuit opens detected with HP TestJet* technology. Shorts Testing: Automatic test with programmable threshold. Analog Component Testing: » Resistance, capacitance and inductance. » Polarity verification on polarized SMT and axial capacitors. » Special tests for diodes, zener diodes, transistors, FETs, fuses, jumpers, switchs and potentiometers.


Powered Testing

Digital Component Testing: » Library-based digital in-circuit component testing. » 5184 hybrid nodes maximum » 6.25 million patterns per second » 625 kHz to 20 MHz clocks » Flash RAM programming capability » Boundary-scan testing

Analog Functional Testing: » Library and user-developed testing of Op-amps, comparators, voltage regulators, etc.


Advanced Performance Digital Testing

High Speed Testing » Pattern rate: Up to 20 million per second High Speed Clocks » 625 kHz to 80 MHz Digital Functional Testing Tools » Timing sets » Backtracing » Fault dictionaries


Advanced Test Capabilities

» Simultaneous testing of up to 4 boards with HP Throughput Multiplier » Built-in analog functional test instruments


Standard System Controller

» HP PA-RISC Controller (Models B180L or C240)


Data subject to change.
* HP TestJet technology is protected under U.S. patent number 5,254,953.


[ Summary ][ Features ][ Specifications ][ Key Literature ][ Ordering ][ Assistance ][ Related ]

HP 3073     Series 3 low-cost combinational board test system, 5184-nodes

Consult with your HP Field Engineer to configure a system to meet your specific needs.


[ Summary ][ Features ][ Specifications ][ Key Literature ][ Ordering ][ Assistance ][ Related ]

No literature is available online at this time.

[ Summary ][ Features ][ Specifications ][ Key Literature ][ Ordering ][ Assistance ][ Related ]

To help you make the right product choices

[ Summary ][ Features ][ Specifications ][ Key Literature ][ Ordering ][ Assistance ][ Related ]

Related Information:


Related Datasheets for HP 3070 Series 3 Family product datasheets:



Privacy Statement    Use of this site indicates that you accept the Terms of Use
Contact HP Test & Measurement. (c) Copyright 1994 - 1998 Hewlett-Packard Company.

Page Updated: Friday January 29 00:14:37 UTC 1999