HP 3172 Series 3 process test system, 2592-Nodes

HP 3172 Series 3 process test system: small footprint and small price.

Process test systems are often used in-line to detect and isolate Surface Mount Technology (SMT) manufacturing process defects.

The HP 3172 Series 3 Process Test System simplifies board test and reduces the cost while retaining the thorough fault coverage necessary for today's high-tech boards. HP provides the flexibility to use innovative test technologies such as HP MagicTest¹ technology or HP TestJet² technology to detect a broad spectrum of manufacturing defects, so boards can be fixed prior to final assembly, further reducing expensive rework. HP TestJet technology is a vectorless testing technique for reliably and automatically detecting solder opens on SMT devices installed on printed circuit boards.

Measurement Quality

• Precision analog in-circuit testing

  Latest Testing Technology

• HP TestJet technology for reliable detection of SMT opens with accurate pin-level diagnostics. No programming is required.

  Software to help the User

• Graphical, menu-driven programming environment

• Built-in CAD translation software

• Built-in testability analysis software

• Built-in quality statistics software

  Expandable across the line

• Expandable to 2592 nodes
• Fixtures and programs are 100% compatible across all HP 3070 systems
• Optional powered test upgrades
• Optional flash RAM programming
• Optional boundary scan software
• Optional HP VEE test software and VXI test instruments

  GENERAL

• Integrated, small foot print system design
• Ergonomically adjustable keyboard and flat-panel display
• Graphical, menu-driven, consultant-based programming environment

  ADVANCED

• Simultaneous testing of up to 4 boards with HP Throughput Multiplier
• HP Panel Test software makes test development of multiple board images on a panel almost as easy as developing one image
• Built-in analog functional test instruments
• Automatically adjusts to calibrated internal sources every 24 hours or 5 degrees Centigrade of temperature change

  PROVEN TEST CAPABILITIES

• Precision 6-wire analog in-circuit testing
• HP TestJet* technology for reliable detection of SMT opens with accurate pin-level diagnostics
• Comprehensive, automatically generated tests for a wide variety of devices:

  shorts	resistors	capacitors	inductors
  parallel R&C	parallel R&L	diodes	zener diodes
  transistors	FETS	potentiometers	fuses
  jumpers	resistor packs

  FAST AND FRIENDLY SOFTWARE TOOLS

• Built-in CAD translation software
• Built-in probe access consultant software
• Built-in testability analysis software
• Built-in quality statistics software
• Built-in panel testing software
• Optional powered test upgrades
• Optional flash RAM programming
• Optional boundary scan software
• Optional HP 3070 Dynamic Test Access solutions (HP MagicTest, HP Boundary-scan InterconnectPlus, and other tools)
• Optional HP VEE test software

Unpowered Testing

Maximum System Capacity: 2592 nodes
Opens Testing: Circuit opens detected with HP TestJet technology.
Shorts Testing: Automatic test with programmable threshold.
Analog Component Testing:
 » Resistance, capacitance and inductance.
 » Polarity verification on polarized SMT and axial capacitors.
 » Special tests for diodes, zener diodes, transistors, FETs, 
fuses, jumpers,	switchs and potentiometers.


Standard System Controller
 » HP PA-RISC Controller (Models B180L or C240)


Powered Testing (Optional)

Digital Component Testing:
	Library-based digital in-circuit component testing.
	288 hybrid nodes maximum
Analog Functional Testing:
	Library and user-developed testing of Op-amps, comparators, voltage
	regulators, etc.
Boundary Scan Testing
Flash RAM Programming
HP VEE Software, Instruments

Footnotes:

1 HP MagicTest technology patent is pending.

2 HP TestJet technology is a vectorless testing technique for reliably and automatically detecting solder opens on SMT devices installed on 
printed circuit boards.  HP TestJet technology is protected under U.S. patent number 5,254,953.

3 Data subject to change.

HP 3172	    Series 3 process test system, 2592-nodes

Consult with your HP Field Engineer to configure a system to meet
your specific needs.