HP 3173 Series 3 low-cost combinational board test system, 2592-Nodes

HP 3173 Series 3 low-cost combinational board test system: large boards, small boards, one affordable system

The HP 3173 Series 3 is the most flexible in-circuit board test system from HP. The HP 3173 can handle large, complex boards with thousands of nodes, mixed-signal components and hybrid technologies. When you are running smaller boards, you can put its extra power to use with HP Throughput Multiplier software that allows up to four boards to be tested and programmed simultaneously.

HP provides the flexibility to use the innovative HP Dynamic Access Test suite, an automated toolset for developing test programs, to test boards with BGAs, CSPs, flip chips and other emerging technologies. Designed specifically for boards with limited access to microscopic components, this test suite preserves nodal access in a shrinking world.

The HP 3173 also supports boundary scan hardware and software, flash RAM programming, automatic short-wire fixturing software, and other tools to accelerate test generation and debug. HP TestJet* technology is a method for reliably detecting SMT opens. HP TestJet technology requires no programming and no debug adjustments.

General

• Expandable to 2592 nodes
• Fixtures and programs are 100% compatible across all HP 3070 systems
• Ergonomically adjustable flat-panel display and keyboard
• Graphical, menu-driven programming environment

  Advanced

  Fast and Friendly Software Tools

• Optional HP 3070 Dynamic Test Access Solutions (HP MagicTest, HP Boundary Scan InterconnectPlus)
• Optional flash RAM programming
• Optional HP VEE test software
• Built-in CAD translation software
• Built-in testability analysis software
• Built-in quality statistics software
• Built-in panel testing software

  PROVEN TEST CAPABILITIES

• Precision 6-wire analog in-circuit testing
• HP TestJet* technology for reliable detection of SMT opens with accurate pin-level diagnostics
• Advanced digital in-circuit testing with >8500 device test libraries
• Comprehensive, automatically generated tests for a wide variety of devices:

  shorts	resistors	capacitors	inductors
  parallel R&C	parallel R&L	diodes	zener diodes
  transistors	FETS	potentiometers	fuses
  jumpers	resistor packs	SSI	MSI
  LSI	VLSI	custom ICs	custom mixed ICs
  connectors	sockets	switches	custom analog ICs
  op amps	comparators	voltage regs	voltage refs
  current sources	opto-isolators	clocks	RS-232 transceivers
  delay lines

  FAST AND FRIENDLY SOFTWARE TOOLS

• Built-in HP 3070 Dynamic Test Access solutions (HP MagicTest, HP Boundary-scan InterconnectPlus, and other tools)
• Built-in flash RAM programming
• Built-in CAD translation software
• Built-in probe access consultant software
• Built-in testability analysis software
• Built-in quality statistics software
• Built-in panel testing software
• Optional HP VEE test software

  EXTRA PERFORMANCE DIGITAL TESTING

• Advanced, high-speed digital in-circuit testing
• High speed clocks
• Digital functional testing capability
• Optional high-performance flash RAM programming capability

  
  

  
  

  Unpowered Testing
  
  Maximum System Capacity: 2592 hybrid nodes
  Opens Testing: Circuit opens detected with HP TestJet* technology.
  Shorts Testing: Automatic test with programmable threshold.
  Analog Component Testing:
   » Resistance, capacitance and inductance.
   » Polarity verification on polarized SMT and axial capacitors.
   » Special tests for diodes, zener diodes, transistors, FETs, 
  fuses, jumpers,	switchs and potentiometers.
  
  
  Powered Testing
  Digital Component Testing:
   » Library-based digital in-circuit component testing.
  	 » 5184 hybrid nodes maximum
  	 » 6.25 million patterns per second
  	 » 625 kHz to 20 MHz clocks
   » Flash RAM programming capability
   » Boundary-scan testing
  
  Analog Functional Testing:
   » Library and user-developed testing of Op-amps, comparators, voltage 
  regulators, etc.
  
  Advanced Performance Digital Testing
  High Speed Testing
   » Pattern rate:  Up to 20 million per second
  High Speed Clocks
   » 625 kHz to 80 MHz 
  Digital Functional Testing Tools 
   » Timing sets
   » Backtracing
   » Fault dictionaries
  
  Advanced Test Capabilities
   » Simultaneous testing of up to 4 boards with HP Throughput Multiplier
   » Built-in analog functional test instruments
  
  Standard System Controller
   » HP PA-RISC Controller (Models B180L or C240)
  
  * HP TestJet technology is protected under U.S. patent number 5,254,953.
  Data subject to change.
  

  
  

  
  

  HP 3173     Series 3 low-cost combinational board test system, 2592-nodes
  
  Consult with your HP Field Engineer to configure a system to meet
  your specific needs.