HP 3179CT Series II Low-Cost Combinational Communications Board Test System

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HP 3179CT Series II Low-Cost Combinational Communications Board Test System: for today's communications manufacturers.

The HP 3179CT Series II Low-Cost Combinational Communications Test System provides manufacturers with the highest throughput, shortest test development times, and maximum flexibility to test today's, and the future's wired access loop electronics. The HP 3179CT can be configured to functionally test POTS, ISDN, pair gain, xDSL, HFC, FITL electronics--all in the same system.

With the optional HP Fault Detective on the HP 3179CT, you can reduce the cost of fault isolation at functional test by at least 50%. HP Fault Detective finds defects in seconds without specialized test equipment,highly skilled technicians or complex programming or simulation. It analyzes the functional test data collected with the HP 3279CT and turns it into a clear diagnosis of failures at the component level.


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Functional Testing

  • Digital

      
      Real time emulation of bitstreams, up to 24 bitstreams in parallel
  Proprietary Bitstreams
  Standard bitstream (E1/T1,IOM2, etc.)
  ISDN S and U interface bitstreams
  High accuracy clocks, up to 24 per system
     
  • Analog
    •   
      1, 2, 4, or 8 channels in parallel
  Tests 1 to 32 channel line cards
  Transmission test suite for rapid test development
  Signaling toolbox for your particular signaling tests

    

    In-Circuit Testing (Optional)
    

  • Precision 6-wire analog in-circuit testing

  • HP TestJet Technology for reliable detection of SMT opens 
with accurate pin-level diagnostics

  • Advanced digital in-circuit testing with >8500 device test libraries

  • Comprehensive, automatically generated tests for a wide variety of devices:
    •   
    	shorts		resistors	capacitors	inductors
	parallel R&C	parallel R&L	diodes		zener diodes
	transistors	FETS		potentiometers	fuses
	jumpers		resistor packs	SSI		MSI	
	LSI		VLSI		custom ICs	custom mixed ICs
	connectors	sockets		switches	custom analog ICs
	op amps		comparators	voltage regs	voltage refs
	current	sources	opto-isolators	clocks		RS-232 transceivers
	delay lines
     

    Advanced System Features

     
  • Simultaneous functional testing of multiple boards, using the parallel channel capabilities
  • Makes or exceeds all relevant ITU-T (Telecommunication Standardization Sector of ITU) specifications
  • System level specifications up to the fixture
  • Graphical, menu-driven programming environment
  • Compatible with HP VEE test software and VXI test instruments
  • Fast, accurate, component level fault isolation (with HP Fault Detective)
  • Upgradeable to include all other capabilities of the HP 3070 family (within configuration limits)
  • Built-in quality statistics software
  • Automatically calibrated every 24 hours or 5 degrees Centigrade of change


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    Unpowered Testing
    

    Maximum System Capacity
        2448 circuit nodes
Opens Testing
        Circuit opens detected with HP TestJet Technology
Shorts Testing
        Automatic test with programmable threshold
Analog Component Testing 
	Resistance, capacitance and inductance
	Polarity verification on polarized SMT and axial capacitors
	Special tests for diodes, zener diodes, transistors, FETs, 
	fuses, jumpers,	switchs and potentiometers

    

    

    Powered testing
    

    Full System Serial Test Capability
	Up to 24 programmable serial test channels, with multiple 
	     processors available on each channel
	Up to 48 DSP processors per system 
POTS Testing
        Up to 8 channels in parallel
        Up to a 32 channel linecard
Digital Component Testing
	Library-based digital in-circuit component testing.
	     5040 hybrid nodes maximum
	     6.25 million patterns per second
	     625 kHz to 20 MHz clocks
	Flash RAM programming capability
	Boundary scan testing
Analog Functional Testing
        Library and user-developed testing of Op-amps, comparators, voltage
	regulators, etc.

    

    

    Advanced Performance Digital Testing
    

    High Speed Testing
        Pattern rate:  Up to 20 million per second
High Speed Clocks
        625 kHz to 80 MHz 
Digital Functional Testing Tools 
        Timing sets
        Backtracing
        Fault dictionaries


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    HP 3179CT     Series II Low-Cost Combinational Communications Board
              Test System

Consult with your HP (Board Test) Field Sales Engineer to configure a
system to meet your specific needs.
    [ Summary ][ Features ][ Specifications ][ Key Literature ][ Ordering ][ Assistance ][ Related ]


    [ Summary ][ Features ][ Specifications ][ Key Literature ][ Ordering ][ Assistance ][ Related ]

    To help you make the right instrument choices

      Your Field Sales Engineer is ready to answer your questions about specifications, applications and ordering. Find your Field Sales Engineer at your Local Sales Office.

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    Related HP 3070 Series II Family of Board Test Systems product datasheets:

    Related product families available online:



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    Page Updated: Thursday November 13 07:34:40 UTC 1997