HP 3275 Series 3 high-performance combinational board test system, 1296-Nodes

HP 3275 Series 3 high-performance combinational board test system: accelerate test execution and development.

The HP 3275 Series 3 high-performance combinational test system stands up to the toughest test challenges on your manufacturing floor. Designed to test leading-edge technologies, this system is ready for what might be coming down the line tomorrow. It combines in-circuit test capabilities -- for today's PCBAs and tomorrow's limited access environment -- with functional test capabilities to reduce your total cost of testing.

If test throughput is your bottleneck, the HP 3275 Series 3 test system responds with industry-leading testing speed and integrated line automation solutions. If time-to-market is your focus, the HP 3275 Series 3 test system helps you with time-saving test development software that speeds your fixture and program development effort.

HP provides the flexibility to use the innovative HP Dynamic Access Test suite, an automated toolset for developing test programs, to test boards with BGAs, CSPs, flip chips and other emerging technologies. Designed specifically for boards with limited access to microscopic components, this test suite preserves nodal access in a shrinking world.

The HP 3275 also supports boundary scan hardware and software, flash RAM programming, automatic short-wire fixturing software, and other tools to accelerate test generation and debug.

GENERAL

• Integrated, small foot print system design
• Expandable to 1296 nodes
• Fixtures and programs are 100% compatible across all HP 3070 systems
• Ergonomically adjustable keyboard and flat-panel display
• Graphical, menu-driven, consultant-based programming environment

ADVANCED

• Simultaneous testing of up to 4 boards with HP Throughput Multiplier
• HP Panel Test software makes test development of multiple board images on a panel almost as easy as developing one image
• Built-in analog functional test instruments
• Automatically adjusts to calibrated internal sources every 24 hours or 5 degrees Centigrade of temperature change

PROVEN TEST CAPABILITIES

• Precision 6-wire analog in-circuit testing
• HP TestJet* technology for reliable detection of SMT opens with accurate pin-level diagnostics
• Advanced digital in-circuit testing with >8500 device test libraries
• Comprehensive, automatically generated tests for a wide variety of devices:

shorts	resistors	capacitors	inductors
parallel R&C	parallel R&L	diodes	zener diodes
transistors	FETS	potentiometers	fuses
jumpers	resistor packs	SSI	MSI
LSI	VLSI	custom ICs	custom mixed ICs
connectors	sockets	switches	custom analog ICs
op amps	comparators	voltage regs	voltage refs
current sources	opto-isolators	clocks	RS-232 transceivers
delay lines

FAST AND FRIENDLY SOFTWARE TOOLS

• Built-in HP 3070 Dynamic Test Access solutions (HP MagicTest, HP Boundary-scan InterconnectPlus, and other tools)
• Built-in flash RAM programming
• Built-in CAD translation software
• Built-in probe access consultant software
• Built-in testability analysis software
• Built-in quality statistics software
• Built-in panel testing software
• Optional HP VEE test software

EXTRA PERFORMANCE DIGITAL TESTING

• Advanced, high-speed digital in-circuit testing
• High speed clocks
• Digital functional testing capability
• Optional high-performance flash RAM programming capability

Unpowered Testing

Maximum System Capacity: 1296 hybrid nodes
Opens Testing: Circuit opens detected with HP TestJet* technology.
Shorts Testing: Automatic test with programmable threshold.
Analog Component Testing:
 » Resistance, capacitance and inductance.
 » Polarity verification on polarized SMT and axial capacitors.
 » Special tests for diodes, zener diodes, transistors, FETs, 
fuses, jumpers,	switchs and potentiometers.


Powered Testing
Digital Component Testing:
 » Library-based digital in-circuit component testing.
	 » 1296 hybrid nodes maximum
	 » 6.25 million patterns per second
	 » 625 kHz to 20 MHz clocks
 » Flash RAM programming capability
 » Boundary-scan testing

Analog Functional Testing:
 » Library and user-developed testing of Op-amps, comparators, voltage 
regulators, etc.

Advanced Performance Digital Testing
High Speed Testing
 » Pattern rate:  Up to 20 million per second
High Speed Clocks
 » 625 kHz to 80 MHz 
Digital Functional Testing Tools 
 » Timing sets
 » Backtracing
 » Fault dictionaries

Standard System Controller
 » HP PA-RISC Controller (Models B180L or C240)

* HP TestJet technology is protected under U.S. patent number 5,254,953.
** HP MagicTest technology patentis pending.
Data subject to change.

HP 3275     Series 3 high-performance combinational board test system, 1296-nodes

Consult with your HP Field Engineer to configure a system to meet
your specific needs.