HP 3279CT Series 3 Combinational Communications Board Test System

HP 3279CT Series 3 Combinational Communications Board Test System: for today's communications manufacturers.

The HP 3279CT Series 3 Combinational Communications Test System provides manufacturers with the highest throughput, shortest test development times, and maximum flexibility to test today's, and the future's wired access loop electronics. The HP 3279CT Series 3 can be configured to functionally test POTS, ISDN, pair gain, HFC, FITL electronics--all in the same system.

With the optional HP Fault Detective software on the HP 3279CT Series 3, you can reduce the cost of fault isolation at functional test by at least 50%. HP Fault Detective finds defects in seconds without specialized test equipment, highly skilled technicians or complex programming or simulation. It analyzes the functional test data you collect with your HP 3279CT Series 3 and turns it into a clear diagnosis of failures at the component level.

Functional Testing

• Digital

Real time emulation of bitstreams, up to 12 bitstreams in parallel
Proprietary Bitstreams
Standard bitstream (E1/T1, IOM2, etc.)
ISDN S and U interfaces
High accuracy clocks, up to 12 per system

• Analog

1, 2, 4, or 8 channels in parallel
Tests 1 to 56 channel line cards
Transmission test suite for rapid test development
Signaling toolbox for your particular signaling tests

• Visual Test Advisor software

New graphical functional test and fixture development environment
Dramatically decreases test development time - reducing time to market
Gets the fixture right the first time
Helps get the job done with fewer or less experienced resources
Aids in ISO 9000 compliance

In-Circuit Testing

• Precision 6-wire analog in-circuit testing
• HP TestJet* technology for reliable detection of SMT opens with accurate pin-level diagnostics
• Advanced digital in-circuit testing with >8500 device test
  libraries
• Comprehensive, automatically generated tests for a wide variety
  of devices:

shorts	resistors	capacitors	inductors
parallel R&C	parallel R&L	diodes	zener diodes
transistors	FETS	potentiometers	fuses
jumpers	resistor packs	SSI	MSI
LSI	VLSI	custom ICs	custom mixed ICs
connectors	sockets	switches	custom analog ICs
op amps	comparators	voltage regs	voltage refs
current sources	opto-isolators	clocks	RS-232 transceivers
delay lines

Advanced System Features

• Meets or exceeds all relevant ITU-T (Telecommunication Standardization Sector of ITU, previously CCITT) specifications
• System level specifications up to the fixture
• Integrated, small foot print system design
• Uncompromised fast parallel throughput: analog, digital, and both at the same time
• Graphical, menu-driven programming environment
• Compatible with HP VEE test software and VXI test instruments
• Fast, accurate, component level fault isolation (with HP Fault Detectivesoftware)
• Upgradeable to include all other capabilities of the HP 3070 family (within configuration limits)
• Built-in quality statistics software
• Automatically adjusts to calibrated internal sources every 24 hours or 5 degrees Centigrade of temperature change

*HP TestJet technology is protected under U.S. patent No. 5,254,953

Unpowered Testing

Maximum System Capacity
        1152 circuit nodes
Opens Testing
        Circuit opens detected with HP TestJet Technology
Shorts Testing
        Automatic test with programmable threshold
Analog Component Testing 
	Resistance, capacitance and inductance
	Polarity verification on polarized SMT and axial capacitors
	Special tests for diodes, zener diodes, transistors, FETs, 
	fuses, jumpers,	switches and potentiometers


Powered Testing
Full System Serial Test Capability
	Up to 12 programmable serial test channels, with multiple 
	     processors available on each channel
	Up to 24 DSP processors per system 
POTS Testing
        Up to 8 channels in parallel
        Up to a 56 channel linecard
Digital Component Testing
	Library-based digital in-circuit component testing.
	     1152 hybrid nodes maximum
	     6.25 million patterns per second
	     625 kHz to 20 MHz clocks
	Flash RAM programming capability
	Boundary scan testing
Analog Functional Testing
        Library and user-developed testing of Op-amps, comparators, voltage
	regulators, etc.


Advanced Performance Digital Testing
High Speed Testing
        Pattern rate:  Up to 20 million per second
High Speed Clocks
        625 kHz to 80 MHz 
Digital Functional Testing Tools
        Timing sets
        Backtracing
        Fault dictionaries

HP 3279CT     Series 3 Combinational Communications Board Test System

Consult with your HP (Board Test) Field Sales Engineer to configure a
system to meet your specific needs.