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HP 4071A Semiconductor Parametric Tester
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![[ Specifications ]](/tmo/datasheets/Graphics/tab-specs-reg.gif)
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The HP 4071A's advanced tester in a test head design minimizes system parasitics, giving you the most reliable test results possible at the highest throughput, accuracy and resolution. The HP 4071A combines HP's latest generation of source/measurement unit (SMU) and matrix designs into a new single unit for easy overhead probing. Future products will share the same mechanical test head specifications.
Measurement Functions: DC Current and DC Voltage,
Capacitance and Conductance,
Differential Voltage
DC Measurements: Spot, Sweep, Pulse, and Pulse Sweep
Measurement subsystem: SMU (Source/Measurement Unit)
Measurement range: 10fA to 100mA, 2UV to 100V (using 2 low current SMU ports)
100fA to 100mA, 2uV to 100V (using 6 standard SMU ports)
C/G Measurement: C/G, C/G-V
Measurement subsystem: HP 4284A Precision LCR Meter
Test frequencies: 1kHz, 10kHz, 100kHz, 1MHz
Measurement range: 1fF to 100nF, 0.1nS to 7.5mS
DC bias voltage: +- 40V
Two Terminal Differential Voltage Measurement:
Measurement subsystem: HP 3458A Digital Multimeter
Measurement range: 1uV to 100V
HP E3101A HP 4071A Semiconductor Parametric Tester For configuration and ordering assistance, please contact your local HP semiconductor test expert.
![[ Summary ]](/tmo/datasheets/Graphics/tab-summary-reg.gif)
![[ Features ]](/tmo/datasheets/Graphics/tab-features-reg.gif)
![[ Specifications ]](/tmo/datasheets/Graphics/tab-specs-reg.gif)
![[ Key Literature ]](/tmo/datasheets/Graphics/tab-keylit-high.gif)
![[ Ordering ]](/tmo/datasheets/Graphics/tab-ordering-reg.gif)
![[ Assistance ]](/tmo/datasheets/Graphics/tab-assistance-reg.gif)
To help you make the
right instrument choices
Related Semiconductor Parametric Test product datasheets:

Page Updated: Thursday November 13 08:34:52 UTC 1997