HP 4071A Semiconductor Parametric Tester

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The HP 4071A semiconductor parametric tester and HP SPECS deliver an easy-to-use, reliable test system. HP understands the special needs of the semiconductor manufacturing industry and has created a hardware/software package that works as a total solution to leverage your investment and drive down your cost of test.

The HP 4071A's advanced tester in a test head design minimizes system parasitics, giving you the most reliable test results possible at the highest throughput, accuracy and resolution. The HP 4071A combines HP's latest generation of source/measurement unit (SMU) and matrix designs into a new single unit for easy overhead probing. Future products will share the same mechanical test head specifications.


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Measurement Functions:    DC Current and DC Voltage,
                          Capacitance and Conductance,
                          Differential Voltage

DC Measurements: Spot, Sweep, Pulse, and Pulse Sweep Measurement subsystem: SMU (Source/Measurement Unit) Measurement range: 10fA to 100mA, 2UV to 100V (using 2 low current SMU ports) 100fA to 100mA, 2uV to 100V (using 6 standard SMU ports)

C/G Measurement: C/G, C/G-V

Measurement subsystem: HP 4284A Precision LCR Meter Test frequencies: 1kHz, 10kHz, 100kHz, 1MHz Measurement range: 1fF to 100nF, 0.1nS to 7.5mS DC bias voltage: +- 40V

Two Terminal Differential Voltage Measurement:

Measurement subsystem: HP 3458A Digital Multimeter Measurement range: 1uV to 100V


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HP E3101A      HP 4071A Semiconductor Parametric Tester

For configuration and ordering assistance, please contact your local
HP semiconductor test expert.

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Related Semiconductor Parametric Test product datasheets:



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Page Updated: Thursday November 13 08:34:52 UTC 1997