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HP 4156A Precision Semiconductor Parameter Analyzer |
The HP 4155A and HP 4156A are the next generation in precision semiconductor parameter analyzers. Now you get the best digital sweep parameter analyzer plus a reliability tester, powerful failure analysis tool, and automated incoming inspection station all rolled into a single instrument.
The HP 4155A and HP 4156A were explicitly designed to provide unprecedented accuracy and functionality for evaluating your sub-micron geometry devices. With one flexible instrument, you can improve your semiconductor quality starting from material evaluation and device characterization all the way through final packaged part inspection and field failure analysis.
The HP parametric analyzers are configured to expand from a one-box
solution to an integrated automated measurement system complete with
low leakage switch, prober support, and Windows-based software for
maximum accuracy, productivity, and ease-of-use.
SMU Measurement Range: SMU Meaurement Resolution:
Voltage 2uV/200V* Voltage 2uV
Current 1fA/1A* Current 1fA
SMU Measurement Accuracy: SMU Pulse Width: 500usec/100msec
Voltage 200uV
Current 20fA
VMU: VMU (differential):
Resolution 2uV Resolution 1uV
Accuracy 100uV Accuracy 100uV
Dual High Voltage Pulse Generator:
Voltage Range +-40V
Output Current 200mA
Min Pulse Width 1us
Min Pulse Period 2us
*The 200V and 1A ranges are available when using the HP 41501A and HPSMU.
HP 4156A Precision Semiconductor Parameter Analyzer For ordering and sales information please contact your local HP semiconductor test expert.
Page Updated: Thursday June 19 16:17:07 UTC 1997