HP 83000 Digital IC Test System Family


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Product Summary

The HP 83000 family of digital IC test systems is designed to address the need for high performance digital device testing in production and engineering development. Fifteen models are available allowing the user to select the optimum combination of performance, production features and cost of test to meet their specific needs. With a choice of data rates up 660 MHz, three frame styles and an architecture designed to lower the cost of test, the HP 83000 family of digital IC testers can provide the capabilities needed to test today's and tomorrow's advanced digital devices.

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Product Features



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Product Specifications

Timing Specifications
Edge placement accuracy          +/- 150ps
Edge-to-edge skew                +/-  75ps
Overall timing accuracy          +/- 300ps

Digital Performance
Driver
                                          ECL level(-1.7V, -0.9V)     CMOS level (0V, 3V)
 AC: transistion time (typical) into 
     1k Ohm || 5 pF load                   0.7ns (20% to 80%)         1.1ns (10% to 90%)
   
     Min. driver pulse width (typical)     1.5ns                      1.5ns

 DC: level range (low level/high level)    -1.5V to 7.0V / -2.0 V to 6.5V

Comparator
 AC:  min. detectable pulse width               less than 1.5ns
 DC:  threshold range (high range/low range)   -1.9V to 7.0V / -2.0V to 6.9V

Programmable loads Range Resolution Active load: currents (ioh/iol) -5.0mA, 30mA 50, 250uA communtation voltage -1.0V to 6.0V 50mV Clamp: Clamp voltage range (High / Low) -1.0V to 7.0V / -2.0V to 5.0V Clamp current (typical) 30 mA Impedence: Pin electronics in active termination 50 Ohms ( |r| less than 10% @ tr greater than 1 ns) DC Parametric Measurement Unit Mode Ranges Voltage force / voltage measure +/-10V, +/-2V Current force / current measure +/-200mA, +/-20mA, +/-2ma, +/-200uA, +/-20uA, +/-2uA Analog Performance Smart Waveform Instrument: 2 channels, each with a digitizer and an arbitrary waveform generator DSP / Memory 1 DSP per channel / 256 k words each Maximum sample rate: 1 Msamples/s Arbitrary waveform generator: (16 bit) output impedence 0 Ohms, 50 Ohms single ended settling time @ 50 Ohms 1us levels +/-10V, +/-2.5V into open Waveform digitizer:(16 bit) input impedence: High impedence, 150 Ohms, 50 Ohms, and 37.5 Ohms levels +/-10V, +/-5V, +/-2.5V, +/-1.25V, +/-0.625V bandwidth 2MHz Smart Video Sampler: 1 channel differential or single ended. Mux into 4 input channels DSP / Memory 256 k words Maximum sample rate static path 1 M samples/s dynamic path 20 M samples/s Output Impedence 10k Ohms, 150 Ohms, 50 Ohms, 37.5 Ohms Voltage Range +/-2.5V, +/-0.625V Offset voltage range +/-2V, +/-6V Resolution static path 16 bits dynamic path 12 bits Anti-aliasing filters: static path 5kHz, 10kHz, 25kHz dynamic path 5MHz, 10MHz, 20MHz Production Device Power Supply Maximum number of supplies 8 (type: four quadrant) Parallel connecion two, three or four supplies Voltage / current ranges Range Resolution Imax Voltage force & measure +/-8V, +/-12V 0.5 mV +/-8A, +/-1A Current force (clamp) +/-8A 0.3 mA Current measure 8A, +/-800mA, +/-80mA 0.3mA, 30uA, 3uA +/-8A Low current range +/-1mA 100nA +/-8A Dynamic Characteristics Ripple and noise 5mVp-p, 1mV rms Voltage settling times <1 ms to +/- 5% of programmed voltage step General Specifications Cooling Liquid / Liquid Primary chilled water 5C to 25C (41F to 77F) Liquid / air (less than 256 channels) Heat dissipation 12 kW maximum Calibration period 3months Line Requirements (512 channels) Line Voltage 120/208V, +/-10% / 230/400V, +/-10% Power Consumption: 22kVA



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Product Ordering Information

HP 83000/F50t     Digital Test System

HP 83000/F80t     Digital Test System

HP 83000/F120t    Digital Test System

HP 83000/F330t    Digital Test System

HP 83000M Model C Multimedia Digital Test System

HP 83000M Model P Multimedia Digital Test System

HP 83000/F50C     Compact Digital Test System

HP 83000/F80C     Compact Digital Test System

HP 83000/F120C    Compact Digital Test System

HP 83000/F240C    Compact Digital Test System

HP 83000/F330C    Compact Digital Test System

HP 83000/F660C    Compact Digital Test System

HP 83000/F240i    Digital Test System

HP 83000/F330i    Digital Test System

HP 83000/F660     Digital Test System



For configuration information and quotation assistance, please
contact your local Hewlett-Packard Semiconductor Test Specialist.



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Page Updated: Thursday June 19 16:09:47 UTC 1997