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HP 83000 Digital IC Test System Family |
The HP 83000 family of digital IC test systems is designed to address
the need for high performance digital device testing in production
and engineering development. Fifteen models are available allowing
the user to select the optimum combination of performance,
production features and cost of test to meet their specific needs.
With a choice of data rates up 660 MHz, three frame styles and an
architecture designed to lower the cost of test, the HP 83000
family of digital IC testers can provide the capabilities needed
to test today's and tomorrow's advanced digital devices.
Related product datasheets available online:
Timing Specifications Edge placement accuracy +/- 150ps Edge-to-edge skew +/- 75ps Overall timing accuracy +/- 300ps Digital Performance Driver ECL level(-1.7V, -0.9V) CMOS level (0V, 3V) AC: transistion time (typical) into 1k Ohm || 5 pF load 0.7ns (20% to 80%) 1.1ns (10% to 90%) Min. driver pulse width (typical) 1.5ns 1.5ns DC: level range (low level/high level) -1.5V to 7.0V / -2.0 V to 6.5V Comparator AC: min. detectable pulse width less than 1.5ns DC: threshold range (high range/low range) -1.9V to 7.0V / -2.0V to 6.9VProgrammable loads Range Resolution Active load: currents (ioh/iol) -5.0mA, 30mA 50, 250uA communtation voltage -1.0V to 6.0V 50mV Clamp: Clamp voltage range (High / Low) -1.0V to 7.0V / -2.0V to 5.0V Clamp current (typical) 30 mA Impedence: Pin electronics in active termination 50 Ohms ( |r| less than 10% @ tr greater than 1 ns) DC Parametric Measurement Unit Mode Ranges Voltage force / voltage measure +/-10V, +/-2V Current force / current measure +/-200mA, +/-20mA, +/-2ma, +/-200uA, +/-20uA, +/-2uA Analog Performance Smart Waveform Instrument: 2 channels, each with a digitizer and an arbitrary waveform generator DSP / Memory 1 DSP per channel / 256 k words each Maximum sample rate: 1 Msamples/s Arbitrary waveform generator: (16 bit) output impedence 0 Ohms, 50 Ohms single ended settling time @ 50 Ohms 1us levels +/-10V, +/-2.5V into open Waveform digitizer:(16 bit) input impedence: High impedence, 150 Ohms, 50 Ohms, and 37.5 Ohms levels +/-10V, +/-5V, +/-2.5V, +/-1.25V, +/-0.625V bandwidth 2MHz Smart Video Sampler: 1 channel differential or single ended. Mux into 4 input channels DSP / Memory 256 k words Maximum sample rate static path 1 M samples/s dynamic path 20 M samples/s Output Impedence 10k Ohms, 150 Ohms, 50 Ohms, 37.5 Ohms Voltage Range +/-2.5V, +/-0.625V Offset voltage range +/-2V, +/-6V Resolution static path 16 bits dynamic path 12 bits Anti-aliasing filters: static path 5kHz, 10kHz, 25kHz dynamic path 5MHz, 10MHz, 20MHz Production Device Power Supply Maximum number of supplies 8 (type: four quadrant) Parallel connecion two, three or four supplies Voltage / current ranges Range Resolution Imax Voltage force & measure +/-8V, +/-12V 0.5 mV +/-8A, +/-1A Current force (clamp) +/-8A 0.3 mA Current measure 8A, +/-800mA, +/-80mA 0.3mA, 30uA, 3uA +/-8A Low current range +/-1mA 100nA +/-8A Dynamic Characteristics Ripple and noise 5mVp-p, 1mV rms Voltage settling times <1 ms to +/- 5% of programmed voltage step General Specifications Cooling Liquid / Liquid Primary chilled water 5C to 25C (41F to 77F) Liquid / air (less than 256 channels) Heat dissipation 12 kW maximum Calibration period 3months Line Requirements (512 channels) Line Voltage 120/208V, +/-10% / 230/400V, +/-10% Power Consumption: 22kVA
HP 83000/F50t Digital Test System HP 83000/F80t Digital Test System HP 83000/F120t Digital Test System HP 83000/F330t Digital Test System HP 83000M Model C Multimedia Digital Test System HP 83000M Model P Multimedia Digital Test System HP 83000/F50C Compact Digital Test System HP 83000/F80C Compact Digital Test System HP 83000/F120C Compact Digital Test System HP 83000/F240C Compact Digital Test System HP 83000/F330C Compact Digital Test System HP 83000/F660C Compact Digital Test System HP 83000/F240i Digital Test System HP 83000/F330i Digital Test System HP 83000/F660 Digital Test System For configuration information and quotation assistance, please contact your local Hewlett-Packard Semiconductor Test Specialist.
Page Updated: Thursday June 19 16:09:47 UTC 1997