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HP 83000 Digital IC Test System Family | |
![[ Summary ]](../Graphics/tab-summary.gif)
![[ Features ]](../Graphics/tab-features.gif)
![[ Specifications ]](../Graphics/tab-specs.gif)
![[ Ordering ]](../Graphics/tab-ordering.gif)
The HP 83000 family of digital IC test systems is designed to address
the need for high performance digital device testing in production
and engineering development. Fifteen models are available allowing
the user to select the optimum combination of performance,
production features and cost of test to meet their specific needs.
With a choice of data rates up 660 MHz, three frame styles and an
architecture designed to lower the cost of test, the HP 83000
family of digital IC testers can provide the capabilities needed
to test today's and tomorrow's advanced digital devices.
Related product datasheets available online:
Timing Specifications
Edge placement accuracy +/- 150ps
Edge-to-edge skew +/- 75ps
Overall timing accuracy +/- 300ps
Digital Performance
Driver
ECL level(-1.7V, -0.9V) CMOS level (0V, 3V)
AC: transistion time (typical) into
1k Ohm || 5 pF load 0.7ns (20% to 80%) 1.1ns (10% to 90%)
Min. driver pulse width (typical) 1.5ns 1.5ns
DC: level range (low level/high level) -1.5V to 7.0V / -2.0 V to 6.5V
Comparator
AC: min. detectable pulse width less than 1.5ns
DC: threshold range (high range/low range) -1.9V to 7.0V / -2.0V to 6.9V
Programmable loads Range Resolution
Active load: currents (ioh/iol) -5.0mA, 30mA 50, 250uA
communtation voltage -1.0V to 6.0V 50mV
Clamp: Clamp voltage range (High / Low) -1.0V to 7.0V / -2.0V to 5.0V
Clamp current (typical) 30 mA
Impedence: Pin electronics in active termination 50 Ohms ( |r| less than 10% @ tr greater than 1 ns)
DC Parametric Measurement Unit
Mode Ranges
Voltage force / voltage measure +/-10V, +/-2V
Current force / current measure +/-200mA, +/-20mA, +/-2ma, +/-200uA, +/-20uA, +/-2uA
Analog Performance
Smart Waveform Instrument: 2 channels, each with a digitizer and an arbitrary waveform generator
DSP / Memory 1 DSP per channel / 256 k words each
Maximum sample rate: 1 Msamples/s
Arbitrary waveform generator: (16 bit)
output impedence 0 Ohms, 50 Ohms single ended
settling time @ 50 Ohms 1us
levels +/-10V, +/-2.5V into open
Waveform digitizer:(16 bit)
input impedence: High impedence, 150 Ohms, 50 Ohms, and 37.5 Ohms
levels +/-10V, +/-5V, +/-2.5V, +/-1.25V, +/-0.625V
bandwidth 2MHz
Smart Video Sampler: 1 channel differential or single ended. Mux into 4 input channels
DSP / Memory 256 k words
Maximum sample rate
static path 1 M samples/s
dynamic path 20 M samples/s
Output Impedence 10k Ohms, 150 Ohms, 50 Ohms, 37.5 Ohms
Voltage Range +/-2.5V, +/-0.625V
Offset voltage range +/-2V, +/-6V
Resolution
static path 16 bits dynamic path 12 bits
Anti-aliasing filters:
static path 5kHz, 10kHz, 25kHz
dynamic path 5MHz, 10MHz, 20MHz
Production Device Power Supply
Maximum number of supplies 8 (type: four quadrant)
Parallel connecion two, three or four supplies
Voltage / current ranges Range Resolution Imax
Voltage force & measure +/-8V, +/-12V 0.5 mV +/-8A, +/-1A
Current force (clamp) +/-8A 0.3 mA
Current measure 8A, +/-800mA, +/-80mA 0.3mA, 30uA, 3uA +/-8A
Low current range +/-1mA 100nA +/-8A
Dynamic Characteristics
Ripple and noise 5mVp-p, 1mV rms
Voltage settling times <1 ms to +/- 5% of programmed voltage step
General Specifications
Cooling
Liquid / Liquid Primary chilled water 5C to 25C (41F to 77F)
Liquid / air (less than 256 channels) Heat dissipation 12 kW maximum
Calibration period 3months
Line Requirements (512 channels)
Line Voltage 120/208V, +/-10% / 230/400V, +/-10%
Power Consumption: 22kVA
HP 83000/F50t Digital Test System HP 83000/F80t Digital Test System HP 83000/F120t Digital Test System HP 83000/F330t Digital Test System HP 83000M Model C Multimedia Digital Test System HP 83000M Model P Multimedia Digital Test System HP 83000/F50C Compact Digital Test System HP 83000/F80C Compact Digital Test System HP 83000/F120C Compact Digital Test System HP 83000/F240C Compact Digital Test System HP 83000/F330C Compact Digital Test System HP 83000/F660C Compact Digital Test System HP 83000/F240i Digital Test System HP 83000/F330i Digital Test System HP 83000/F660 Digital Test System For configuration information and quotation assistance, please contact your local Hewlett-Packard Semiconductor Test Specialist.
To help you make the
right instrument choices

Page Updated: Thursday June 19 16:09:47 UTC 1997