HP 83000 F660 Series High-Performance VLSI Test Systems

As design, simulation and fabrication methods for ICs constantly improve, today’s IC designers and test engineers demand increasingly high levels of accuracy, validity and reliability from the tests they use to evaluate prototype devices. The HP 83000 F660 Series is a high-performance VLSI test system designed specifically to address the current needs of IC test developers. It also has the capability to shorten the time-to-market by reducing design cycles and closing the gap between engineering and production.

[ Features ]

50 ps timing accuracy for unmatched test accuracy
High-speed 660 MHz vector rate with RZ signal format
Up to 1024 independent I/O channels, each with full test resources, provide flexibility and ability to handle high-volume production
Application specific tools, such as APG and bitmap for memory testing, dedicated tests for telecom and datacom ICs, and a boundary scan test generator, guarantee versatility
Mouse-driven, task-oriented user interface software and easy-to- use DUT interface hardware maximize usability
Modular, compact design combined with high reliability and low power consumption insure cost efficiency

[ Specifications ]

Contact your local HP sales representative for system specifications.

[ Ordering ]

HP 83000 F660 Series High-Performance VLSI Test System

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