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HP 84000 Series High Throughput RFIC Test Systems | |
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The HP 84000 series RFIC test systems have been designed to minimize your investment, investment risk, and your time-to- market for new RFIC devices. With per-device test-throughput times as low as 500 milliseconds and system uptimes achievable to better than 97%, the HP 84000 series meets the low cost-of-test and high throughput required in today’s competitive environment. In addition, HP can supply more than just the test system. We can work with you to design your test fixturing, write your test plans, and integrate your handler. And, by building upon over 50 years of Hewlett-Packard RF design and measurement experience, the HP 84000 series test systems provide unmatched RF measurement integrity and stability.
The HP 84000 series offers three models, each configured for specific testing needs. The model A20i is configured to test RF amplifiers or other two-port devices; model A50t is configured to test one or two RF function devices and model A80t is configured to test multi-port RFIC's.
84000 Model A20i
System Summary
Configured for two RF ports Full suite of RF/DC measurements included S-Parameters (gain, loss, isolation, impedance, return loss, VSWR) Harmonics Output Power DC Current Gain Compression Efficiency Frequency Voltages Known Spurious Phase Noise
Operating Characteristics
Frequency Range: 50 MHz to 3 GHz RF Source Power at DUT: +8 dBm typical RF Input Power Range: –90 dBm to +37 dBm System Receiver Dynamic Range: 90 dB RF Ports: 2 HF Ports: 3 DAC/DUT-Control Lines: 16 DC Port (16 V, 0.5 A): 1 DC Ports (16 V, 1.5 A): 2 DC Port (50 V, 0.5 A): 1
Typical Devices Tested
Power Amplifiers LNAs Attenuators
Optional System Capabilities
Additional RF Port Extend to 18 GHz +20 dBm, +30 dBm power to DUT Noise Figure Measurements Amplifier TOI Measurements Mixer TOI Mixer Conversion Loss/Gain Mixer Leakages Adjacent Channel Power
HP 84000 Model A50t
System Summary
Configured for three RF ports Full suite of RF/DC measurements included S-parameters (gain, loss, isolation, impedance, return loss, VSWR) Harmonics Output Power DC Current Gain Compression Efficiency Frequency Voltages Known Spurious Mixer Conversion Loss/Gain Mixer Leakages Amplifier TOI Noise Figure Phase Noise
Operating Characteristics
Frequency Range: 10 MHz to 3 GHz RF Source Power at DUT: +3 dBm typical RF Input Power Range: –90 dBm to +37 dBm System Receiver Dynamic Range: 90 dB RF Ports: 3 HF Ports: 3 DAC/DUT-Control Lines: 16 DC Port (16 V, 0.5 A): 1 DC Ports (16 V, 1.5 A): 2 DC Port (50 V, 0.5 A): 1
Typical Devices Tested
Power Amplifiers LNAs Attenuators RF Switches Upconverters Downconverters RF Multiplexers I/Q Modulators
Optional System Capabilities
Additional RF Ports Extend to 18 GHz +20 dBm, +30 dBm Power to DUT I/Q Modulator Suppression Mixer TOI Unknown Spurious Signals Adjacent Channel Power
HP 84000 Model A80t
System Summary
Configured for six RF ports Full suite of RF/DC measurements included S-Parameters (gain, loss, isolation, impedance, return loss, VSWR) Harmonics Output Power DC Current Gain Compression Efficiency Frequency Voltages Known Spurious Mixer Conversionloss/Gain Mixer Leakages Amplifier TOI Mixer TOI Noise Figure Phase Noise
Operating Characteristics
Frequency Range: 10 MHz to 3 GHz RF Source Power at DUT: +20 dBm typical RF Input Power Range: –90 dBm to +37 dBm System Receiver Dynamic Range: 90 dB RF Ports: 6 HF Ports: 6 DAC/DUT-Control Lines: 16 DC Ports (16 V, 0.5 A): 2 DC Ports (16 V, 1.5 A): 4 DC Ports (50 V, 0.5 A): 2
Typical Devices Tested
Power Amplifiers LNAs Attenuators RF Switches RF Multiplexers I/Q Modulators VCOs Integrated Receivers Integrated Transmitters Upconverters Downconverters Complete Tranceivers
Optional System Capabilities
Additional RF Ports Extend to 18 GHz +30 dBm Power to DUT Unknown spurious Signals I/Q modulator Suppression Additional Mixer TOI Adjacent Channel Power
HP 84000 Series High Throughput RFIC Test Systems HP 84000 Model A20i HP 84000 Model A50t HP 84000 Model A80tHP 84000 Series High Throughput RFIC Test Systems
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Page Updated: Thursday June 19 16:14:34 UTC 1997