HP 85070M Dielectric Probe Measurement System, 3 GHz

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Measure the dielectric properties of materials quickly and conveniently with the HP 85070M dielectric probe measurement system. Measurements made with this probe are nondestructive and require no sample preparation -- saving you time, trouble, and materials. A measurement system based on the HP 85070B dielectric probe yields permittivity (dielectric constant), loss factor, loss tangent, or Cole-Cole diagrams -versus frequency- from 200 MHz to 20 GHz (depending on the network analyzer and material). The HP 85070M is a fully configured materials measurement system consisting of the HP 85070B dielectric probe kit, network analyzer, cable, probe stand, and pre-configured HP Vectra PC.


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Frequency Range
Probe:                        200 MHz to 20 GHz, nominal
Maximum Limited by MUT Properties
                              <110/( |er* | ) ^1/2 GHz
Temperature
Range:                        -40 °C to +200 °C
Rate:                         <10 °C,  per minute
Accuracy (typical)
Dielectric constant, er':     ±5%
Loss Tangent, Tan Delta, er"/er'
                              ±0.05
Repeatability and Resolution (typical)	
                              Two to four times better than accuracy
Material Under Test Assumptions 	
                              Material is "infinite" in size, non-magnetic 
                              (µr* = 1), isotropic (uniform orientation), 
                              and homogeneous (uniform composition)1.  
                              Solids have a single, smooth, flat2 
                              surface with gap-free contact at the probe face.  
Sample Requirements
Diameter:                     >20 mm
Thickness:                    >20/( |er* | )^1/2 mm
Granule Size3:                 <0.3 mm
Maximum Recommended er':      <100
Minimum Recommended tan delta4
                              >0.05


1If the material is not homogeneous, the result is an average value 
weighted by the intensity of the E-field which is highest at the 
center conductor of the probe tip.
2Sample must be as flat as the probe face which is lapped to 
±100 µ inches.
31Measurement repeatability for granular materials is dependent on 
density variation. 
4Not recommended for low loss (tan delta <0.5) materials with er' >5.


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HP 85070M     3 GHz Dielectric Probe Measurement System
   Opt 1FF    Deletes HP Vectra PC
   Opt 020    20 GHz System


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HP 85070M Dielectric Probe Measurement System, 3 GHz, Technical Specifications ( PDF)

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