HP 85109C Network Analyzer System (45 MHz to 75 or 110 GHz)


[ Summary ][ Features ][ Specifications ][ Ordering ][ Assistance ]

Product Summary

When combined with Cascade probes, the HP 85109C network analyzer system provides superior on-wafer measurement system, from 45 MHz to 75 GHz, or optionally to 110 GHz. Based on the HP 8510C network analyzer, the HP 85109C provides the highest performance in frequency coverage, dynamic range, and measurement accuracy. All the main system instruments, except for the HP 8510C, are integrated in a system rack prior to shipment from the factory. Installation is included at no additional charge.

To achieve superior dynamic range and still provide a single connection, the HP 85109C uses special low-loss test port combiners that couple the RF outputs of two test sets into a single 1.85 mm coaxial interface to wafer probes or a coaxial device. The system software enables performance of a single on-wafer or coaxial calibration, by automatically switching test bands and combining data from each test set. Error-corrected measurements are then displayed on the HP 8510C. The software alsocontrols dc biasing to the test device, providing the stimulus, calibration and measurement triggering normally accessed from the network analyzer front panel.

The HP 85109C offers short-open-load-thru (SOLT) calibration on 1.85 mm coax from 45 MHz to 65 GHz and line-reflect-match (LRM) for on-wafer measurements over the system's full frequency range.


[ Summary ][ Features ][ Specifications ][ Ordering ][ Assistance ]

Product Features



[ Summary ][ Features ][ Specifications ][ Ordering ][ Assistance ]

Product Specifications

Dynamic Range (1)
 
The following table shows the system characteristics at the test 
ports.  In the combined mode, the system test ports are at the 
ends of the 50.8 cm (20 inches) long 1.85 mm coax cables at the 
output of the combiners.  In V-band or W-band mode, the system 
includes the two waveguide-to-coax adapters and the 1.0 mm cable 
at each port, so the system test ports are at the end of each 
adapter-cable-adapter combination.


				Frequency Range (GHz)
				
			0.045 	2 	20	40	50	50	75
			to 2	to 20	to 40	to 50	to 65	to 75	to 110
Maximum power (dBm)
 measured at port 2	+17 	+8 	+6	+2	+19	+15	+6	

Reference power (dBm)
 at port 1 (nominal)	+1	-8	-21	-35	-10	-5	-10	

Minimum power (dBm)
 measured at port 2	-75	-96	-88	-84	-65	-69	-71

Receiver 
 dynamic range(dB)	92	104	94	86	84	84	77	

System 
 dynamic range(dB)	76	88	67	49	55	64	61

(1)  Limited by compression level and system noise floor.  
Noise floor is measured with full two-port error correction, 
1024 averages.



[ Summary ][ Features ][ Specifications ][ Ordering ][ Assistance ]

Product Ordering Information

HP 85109C	Network Analyzer System (45 MHz to 75 or 110 GHz)
   Opt 002	delete HP 8350B/83540A Sweep Oscillator and add HP 83621A Synthesizer as LO source
   Opt 007	add high power and high dynamic range configuration to the HP 8517B test set
   Opt 010	add time domain capability to HP 8510C
   Opt 110	adds HP W85104A Option H08 W-band test set, and HP W85104A	Option K10 interface hardware for connecting to wafer probes
   Opt 230	provides system cabinet set up for 220/240V operation

Custom pulsed bias configurations for high power (>100W) and 
narrow pulses (<1usec) can be integrated into any pulsed-RF system.

All orders include the following:



[ Summary ][ Features ][ Specifications ][ Ordering ][ Assistance ]

To help you make the right instrument choices



Contact HP Test & Measurement. (c) Copyright 1994, 1995, 1996, 1997 Hewlett-Packard Company.

Page Updated: Thursday June 19 16:17:20 UTC 1997