HP 85118A High-Power Amplifier Test System

The HP 85118A series test systems are designed expressly to perform high-speed characterization of high-frequency, high-power amplifiers, such as those used in many wireless communication systems. These systems use industry-standard instrument and computer platforms that can be easily reconfigured to test different devices. The flexible architecture incorporates a single-connection, multiple measurement (SCMM) design to optimize the entire system for maximum measurement throughput. The amplifier test software runs on a powerful HP 9000 Series 700 workstation under the HP-UX operating system. HP systems engineers work with you to tailor a standard system to meet your requirements. In addition, HP will develop, procure, and integrate specialized test fixtures, parts handlers, and other customized equipment to optimize the system for your needs.

[ Features ]

Broad frequency coverage from 45 MHz to 20 GHz; extendable to 50 GHz
High-speed S-parameter, power level, distortion, and spur search measurements
Fully error-corrected measurements under CW or pulsed measurement conditions
High RF-power handling up to 400 watts (+50 dBm) average
Measurement of small- and large-signal gain, gain-slope, and gain-compression
Optional pulsed bias capabilities to 20 V at 10 amps

[ Specifications ]

Operating Characteristics
Frequency Range(in bands, depending on RF power):		
                              45 MHz to 20 GHz 
   Optional Range:            45 MHz to 50 GHz
RF Power Range
   Supplied to DUT:           -40 dBm to +30 dBm
   Received from DUT:         up to +46 dBm (40 W)
Receiver Dynamic Range¹
   S21 Forward:               80 dB
   S12 Reverse:               40 dB
Instrument Data Acquisition Speed²
   S-Parameters:              0.25 msec/point (CW operation)
                              0.56 msec/point (pulsed operation)
   Noise Figure³:             2 seconds/point to ±0.35 dB accuracy
                              0.3 seconds/point to ±0.5 dB accuracy


¹Receiver dynamic range is measured from system 0.1 dB compression 
point to system noise floor, S/N = 1
²Spectrum analysis measurement time is a function of system 
sensitivity and spurious signal search requirements
³Noise figure is measured using vector error correction for 
enhanced accuracy

[ Ordering ]

HP 85118A High-Power Amplifier Test System Please contact your local HP sales representative to order this and other tailored microwave test systems available from Hewlett-Packard.

[ Key Literature ]

HP 8510 System Solutions, Brochure ( PDF)

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[ Assistance ]

To help you make the right product choices

Local Sales Office

[ Related ]

Related product families available online:

RF and Microwave Measurement Systems