HP 85120A Series T/R Module Test Systems

The HP 85120A series test systems are designed for complete RF characterization of transmit/receive modules and related MMIC devices. The flexible architecture incorporates a single-connection, multiple measurement (SCMM) design combined with high-speed measurement capability and multi-state device control to optimize the entire system for maximum measurement throughput. Versions are available for on-wafer, packaged device, or subassembly testing. These systems use industry-standard instrument and computer platforms that can be easily reconfigured to test different devices. The test system software runs on a powerful HP 9000 Series 700 workstation under the HP-UX operating system. HP systems engineers work with you to tailor a standard system to meet your requirements. In addition, HP will develop, procure, and integrate specialized test fixtures, parts handlers, and other customized equipment to optimize the system for your needs.

[ Features ]

Broad frequency coverage from 2 to 20 GHz; extendable to 50 GHz
High-speed S-parameter, noise figure, power level, distortion, and compression measurements
Reconfigurable test plans using graphical user interface.
Fully error-corrected S-parameter measurements under CW or pulsed-RF conditions
Independent DC, RF, and device-state control for maximum system efficiency
Data-acquisition rates of up to 5,000 points per second
Optional pulsed DC bias and 5 nSec resolution RF pulse capabilities

[ Specifications ]

Operating Characteristics
Frequency Range:              2 to 20 GHz
Optional Ranges:              1 to 18 GHz and 2 to 50 GHz

RF Power Range
Supplied to DUT:              -30 to +20 dBm
Received from DUT:            up to 43 dBm (20 W)

RF Pulse Widths:              1 µs to 400 ms

Receiver Dynamic Range¹
CW S-Parameters:              90 dB
Pulsed S-Parameters:          65 to 90 dB
Spectrum Analysis:            >100 dB

Receiver Acquisition Speed²

S-Parameters:                 0.25 msec/point (CW operation)
                              0.56 msec/point (pulsed operation)
Noise Figure:                 1.0 seconds/point to ±0.3 dB accuracy
                              0.1 seconds/point to ±0.35 dB accuracy
                              0.01 seconds/point to ±0.6 dB accuracy
	              			


¹Receiver dynamic range is measured from system 0.1 dB compression 
point to system noise floor, S/N = 1.
²Noise figure speeds based on a DUT with 20 dB gain, 5 dB noise figure and
input/output matches of <1.5:1.

Declarations of Conformity

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European Regulatory Declarations of Conformity.

[ Ordering ]

HP 85120A Series T/R Module Test Systems Please contact your local HP sales office to order this and other tailored microwave test systems available from Hewlett-Packard.

[ Key Literature ]

HP 8510 System Solutions, Brochure ( PDF)
HP 85120A Series T/R Module Automated Test Systems, Product Overview ( PDF)

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[ Assistance ]
Additional help is a click away!

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This service is available only in the United States. For assistance outside the U.S., contact your local HP DIRECT or HP Sales Office.

[ Related ]

Related product families available online:

RF and Microwave Measurement Systems