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CD4001BM  Product Folder

Quad 2-Input NOR/NAND Buffered B Series Gate
Generic P/N 4001BM
General
Description
Features Datasheet Package
& Models
Samples
& Pricing
Reliability
Metrics

Parametric Table Parametric Table
Temperature Min (deg C) -55 
Temperature Max (deg C) 125 

Datasheet

TitleSize in KbytesDate
View Online

Download

Receive via Email
CD4001BM CD4001BC Quad 2-Input NOR Buffered B Series Gate CD4011BM CD4011BC Quad 2-Input NAND Buffered B Series Gate 167 Kbytes 8-Jan-98 View Online Download Receive via Email
CD4001BM Mil-Aero Datasheet MNCD4001BM-X 15 Kbytes   View Online Download Receive via Email

If you have trouble printing or viewing PDF file(s), see Printing Problems.

Package Availability, Models, Samples & Pricing

Part NumberPackageStatusModelsSamples &
Electronic
Orders
Budgetary PricingStd
Pack
Size
Package
Marking
TypePinsMSL/Lead-Free AvailabilityLead
Time
QtySPICEIBISQty$US each
CD4001BMJ/883CERDIP14StatusFull productionN/AN/A 50+$3.80rail
of
25
NS ZSSXXYYA
CD4001BMJ
/883QL >
7-9 weeks500

Obsolete Parts

Obsolete PartAlternate Part or SupplierSourceLast Time Buy Date
CD4001BMW/883
CD4001BMJ/883
NATIONAL SEMICONDUCTOR
06/08/99

General Description

These quad gates are monolithic complementary MOS (CMOS) integrated circuits constructed with N- and P-channel enhancement mode transistors. They have equal source and sink current capabilities and conform to standard B series output drive. The devices also have buffered outputs which improve transfer characteristics by providing very high gain.

All inputs are protected against static discharge with diodes to VDD and VSS.

Features

  • Low power TTL: Fan out of 2 driving 74L compatibility: or 1 driving 74LS
  • 5V-10V-15V parametric ratings
  • Symmetrical output characteristics
  • Maximum input leakage 1 µA at 15V over full temperature range

Reliability Metrics

Part Number Process Early Failure Rate - Rejects Sample Size (EFR) PPM * Rel. Rejects Device Hours Long Term Failure Rates (FITS) MTTF
CD4001BMJ/883CMOS09000004000009113095470

For more information on Reliablitity Metrics, please click here.


[Information as of 15-Jan-2004]