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MM54C906  Product Folder

Hex Open Drain N-Channel Buffers
Generic P/N 54C906
General
Description		 Features Datasheet Package
& Models		 Samples
& Pricing		 Reliability
Metrics

Parametric Table Parametric Table
Temperature Min (deg C) -55 
Temperature Max (deg C) 125 

Datasheet

TitleSize in KbytesDate
View Online
Download
Receive via Email
MM54C906 Hex Open Drain N-Channel Buffers MM54C907 MM74C907 Hex Open Drain P-Channel Buffers 106 Kbytes 8-Jan-98 View Online Download Receive via Email
MM54C906 Mil-Aero Datasheet MNMM54C906-X 12 Kbytes   View Online Download Receive via Email

If you have trouble printing or viewing PDF file(s), see Printing Problems.

Package Availability, Models, Samples & Pricing

Part NumberPackageStatusModelsSamples &
Electronic
Orders		Budgetary PricingStd
Pack
Size		Package
Marking
TypePinsMSL/Lead-Free AvailabilityLead
Time		QtySPICEIBISQty$US each
MM54C906J/883CERDIP14StatusFull productionN/AN/A 
Buy Now		50+$14.00rail
of
25		NSZSSXXYYA>
MM54C906J/883QL
8-10 weeks500

Obsolete Parts

Obsolete PartAlternate Part or SupplierSourceLast Time Buy Date
MM54C906W/883
MM54C906J/883
NATIONAL SEMICONDUCTOR
09/08/98

General Description

These buffers employ monolithic CMOS technology in achieving open drain outputs. The MM54C906/MM74C906 consists of six inverters driving six N-channel devices; and the MM54C907/MM74C907 consists of six inverters driving six P-channel devices. The open drain feature of these buffers makes level shifting or wire AND and wire OR functions by just the addition of pull-up or pull-down resistors. All inputs are protected from static discharge by diode clamps to VCC and to ground.

Features

  • Wide supply voltage range: 3V to 15V
  • Guaranteed noise margin: 1V
  • High noise immunity: 0.45 VCC (typ.)
  • High current sourcing and sinking open drain outputs

Reliability Metrics

Part Number Process Early Failure Rate - Rejects Sample Size (EFR) PPM * Rel. Rejects Device Hours Long Term Failure Rates (FITS) MTTF
MM54C906J/883CMOS09000004000009113095470

For more information on Reliablitity Metrics, please click here.


[Information as of 15-Jan-2004]

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