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SCAN16512  Product Folder

Low Voltage Universal 16-bit IEEE 1149.1 Bus Transceiver with TRI-STATE Outputs
Generic P/N 16512
General
Description		 Features Datasheet Package
& Models		 Samples
& Pricing		 Reliability
Metrics

Parametric Table Parametric Table
Temperature Min (deg C) -40 
Temperature Max (deg C) 85 

Datasheet

TitleSize in KbytesDate
View Online
Download
Receive via Email
SCAN16512 Low Voltage Universal 16-bit IEEE 1149.1 Bus Transceiver with TRI-STATE Outputs 160 Kbytes 14-Aug-02 View Online Download Receive via Email

If you have trouble printing or viewing PDF file(s), see Printing Problems.

Package Availability, Models, Samples & Pricing

Part NumberPackageStatusModelsSamples &
Electronic
Orders		Budgetary PricingStd
Pack
Size		Package
Marking
TypePinsMSL/Lead-Free AvailabilityLead
Time		QtySPICEIBISQty$US each
SCAN162512SMFBGA64StatusPreliminaryN/As162512.ibs 
Buy Now 		1K+$3.25tray
of
360		NSUZXYTT
SCAN162512
SM
6 weeks0
SCAN16512SMFBGA64StatusPreliminaryN/As16512.ibs 
Buy Now 		1K+$3.25tray
of
360		NSUZXYTT
SCAN16512
SM
6-7 weeks2000
SCANH162512SMFBGA64StatusPreliminaryN/Ash162512.ibs 
Buy Now		1K+$3.25tray
of
360		NSUZXYTT
SCANH162512
SM
6 weeks2000
SCANH16512SMFBGA64StatusPreliminaryN/Ash16512.ibs 
Buy Now		1K+$3.25tray
of
360		NSUZXYTT
SCANH16512
SM
6 weeks0
SCAN162512SMXFBGA64StatusPreliminaryN/As162512.ibs 1K+$3.25reel
of
2000		NSUZXYTT
SCAN162512
SM
6 weeks0
SCAN16512SMXFBGA64StatusPreliminaryN/As16512.ibs 1K+$3.25reel
of
2000		NSUZXYTT
SCAN16512
SM
6 weeks0
SCANH162512SMXFBGA64StatusPreliminaryN/Ash162512.ibs 1K+$3.25reel
of
2000		NSUZXYTT
SCANH162512
SM
6 weeks0
SCANH16512SMXFBGA64StatusPreliminaryN/Ash16512.ibs 1K+$3.25reel
of
2000		NSUZXYTT
SCANH16512
SM
6 weeks0
SCANH162512 MDCUnpackaged DieFull productionN/AN/ASamples  tray
of
N/A		-
N/A0
SCANH162512 MWCWaferFull productionN/AN/A   wafer jar
of
N/A		-
N/A0

General Description

The SCAN16512 is a high speed, low-power universal bus transceiver featuring data inputs organized into two 8-bit bytes with output enable and latch enable control signals. This function is configurable as a D-type Latch or Flip-Flop, and can operate in transparent, latched, or clocked mode. This device is compliant with IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture with the incorporation of the defined boundary-scan test logic and test access port consisting of Test Data Input (TDI), Test Data Out (TDO), Test Mode Select (TMS), Test Clock (TCK), and Test Reset (TRST#).

Features

  • IEEE 1149.1 (JTAG) Compliant
  • 2.7V to 3.6V VCC Operation
  • TRI-STATE outputs for bus-oriented applications
  • Dual byte-wide data for bus applications
  • Power down high Impedance inputs and outputs
  • Optional Bus Hold on data inputs eliminates the need for external pullup/pulldown resistors (SCANH16512, SCANH162512 versions)
  • Optional 25 series resistors in outputs to minimize noise and eliminate termination resistors (SCAN162512, SCANH162512 versions)
  • Supports live insertion/withdrawal
  • Includes CLAMP and HIGHZ instructions

Reliability Metrics

Part Number Process Early Failure Rate - Rejects Sample Size (EFR) PPM * Rel. Rejects Device Hours Long Term Failure Rates (FITS) MTTF
SCAN162512SMCMOS721420014108000005226190940
SCAN162512SMXCMOS721420014108000005226190940
SCAN16512SMCMOS721420014108000005226190940
SCAN16512SMXCMOS721420014108000005226190940
SCANH162512 MDCCMOS721420014108000005226190940
SCANH162512 MWCCMOS721420014108000005226190940
SCANH162512SMCMOS721420014108000005226190940
SCANH162512SMXCMOS721420014108000005226190940
SCANH16512SMCMOS721420014108000005226190940
SCANH16512SMXCMOS721420014108000005226190940

For more information on Reliablitity Metrics, please click here.


[Information as of 15-Jan-2004]

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