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SCAN16602  Product Folder

Low Voltage Universal 16-bit IEEE 1149.1 Bus Transceiver with TRI-STATE Outputs
Generic P/N 16602
General
Description		 Features Datasheet Package
& Models		 Samples
& Pricing		 Reliability
Metrics

Parametric Table Parametric Table
Temperature Min (deg C) -40 
Temperature Max (deg C) 85 

Datasheet

TitleSize in KbytesDate
View Online
Download
Receive via Email
SCAN16602 Low Voltage Universal 16-bit IEEE 1149.1 Bus Transceiver with -TRISTATE Outputs 132 Kbytes 31-Jul-03 View Online Download Receive via Email

If you have trouble printing or viewing PDF file(s), see Printing Problems.

Package Availability, Models, Samples & Pricing

Part NumberPackageStatusModelsSamples &
Electronic
Orders		Budgetary PricingStd
Pack
Size		Package
Marking
TypePinsMSL/Lead-Free AvailabilityLead
Time		QtySPICEIBISQty$US each
SCAN162602SMFBGA64StatusFull productionN/AN/A 
Buy Now 		1K+$3.25tray
of
360		NSUZXYTT
SCAN162602
SM
2 weeks0
SCAN16602SMFBGA64StatusFull productionN/AN/A 
Buy Now 		1K+$3.25tray
of
360		NSUZXYTT
SCAN16602
SM
2 weeks0
SCANH162602SMFBGA64StatusFull productionN/AN/A 
Buy Now 		1K+$3.25tray
of
360		NSUZXYTT
SCANH162602
SM
2 weeks0
SCANH16602SMFBGA64StatusFull productionN/AN/A 
Buy Now 		1K+$3.25tray
of
360		NSUZXYTT
SCANH16602
SM
2 weeks0
SCAN162602SMXFBGA64StatusFull productionN/AN/A 1K+$3.25reel
of
2000		NSUZXYTT
SCAN162602
SM
6 weeks0
SCAN16602SMXFBGA64StatusFull productionN/AN/A 1K+$3.25reel
of
2000		NSUZXYTT
SCAN16602
SM
6 weeks0
SCANH162602SMXFBGA64StatusFull productionN/AN/A 1K+$3.25reel
of
2000		NSUZXYTT
SCANH162602
SM
6 weeks0
SCANH16602SMXFBGA64StatusFull productionN/AN/A 1K+$3.25reel
of
2000		NSUZXYTT
SCANH16602
SM
6 weeks0

General Description

The SCAN16602 is a high speed, low-power universal bus transceiver featuring data inputs organized into two 8-bit bytes with separate output enable and latch enable control signals. The byte-wide output enable controls are complimentary to allow direction control with a single R/W# line and no additional logic. This function is configurable as a D-type Latch or Flip-Flop, and can operate in transparent, latched, or clocked mode. This device is compliant with IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture with the incorporation of the defined boundary-scan test logic and test access port consisting of Test Data Input (TDI), Test Data Out (TDO), Test Mode Select (TMS), Test Clock (TCK), and Test Reset (TRST#).

Features

  • IEEE 1149.1 (JTAG) Compliant
  • 2.7V to 3.6V VCC Operation
  • TRI-STATE outputs for bus-oriented applications
  • Dual byte-wide data for bus applications
  • Power down high Impedance inputs and outputs
  • Optional Bus Hold on data inputs eliminates the need for external pullup/pulldown resistors (SCANH16602, SCANH162602 versions)
  • Optional 25 series resistors in outputs to minimize noise and eliminate termination resistors (SCAN162602, SCANH162602 versions)
  • Supports live insertion/withdrawal
  • Includes CLAMP and HIGHZ instructions

Reliability Metrics

Part Number Process Early Failure Rate - Rejects Sample Size (EFR) PPM * Rel. Rejects Device Hours Long Term Failure Rates (FITS) MTTF
SCAN162602SMCMOS721420014108000005226190940
SCAN162602SMXCMOS721420014108000005226190940
SCAN16602SMCMOS721420014108000005226190940
SCAN16602SMXCMOS721420014108000005226190940
SCANH162602SMCMOS721420014108000005226190940
SCANH162602SMXCMOS721420014108000005226190940
SCANH16602SMCMOS721420014108000005226190940
SCANH16602SMXCMOS721420014108000005226190940

For more information on Reliablitity Metrics, please click here.


[Information as of 15-Jan-2004]

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