SCAN18374T  Product Folder

The SCAN18374T is a high speed, low-power D-type flip-flop featuring separate D-type inputs organized into dual 9-bit bytes with byte-oriented clock and output enable control signals. This device is compliant with IEEE 1149.1 Standard Test Access Port and BOUNDARY-SCAN Architecture with the incorporation of the defined BOUNDARY-SCAN test logic and test access port consisting of Test Data Input (TDI), Test Data Out (TDO), Test Mode Select (TMS), and Test Clock (TCK).

• IEEE 1149.1 (JTAG) Compliant
• Buffered positive edge-triggered clock
• TRI-STATE outputs for bus-oriented applications
• 9-bit data busses for parity applications
• Reduced-swing outputs source 24 mA/sink 48 mA (Mil)
• Guaranteed to drive 50 Ohm transmission line to TTL input levels of 0.8V and 2.0V
• TTL compatible inputs
• 25 mil pitch Cerpack packaging
• Includes CLAMP and HIGHZ instructions
• Standard Microcircuit Drawing (SMD) 5962-9320701