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SCAN50C400  Product Folder

1.25/2.5/5.0 Gbps Quad Multi-rate Backplane Transceiver
Generic P/N 50C400
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General
Description
Features Datasheet

Datasheet

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SCAN50C400 1.25 2.5 5.0 Gbps Quad Multi-rate Backplane Transceiver 849 Kbytes 9-Jan-04 View Online Download Receive via Email

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General Description

The SCAN50C400 is a four-channel high-speed backplane transceiver (SERDES) designed to support multiple line data rates at 1.25, 2.5 or 5.0 Gbps over a printed circuit board backplane. It provides a data link of up to 20 Gbps total through-put in each direction.

Each transmit section of the SCAN50C400 takes a 4-bit differential LVDS source synchronous data bus, serializing it to a differential high-speed serial bit stream and output from a CML driver. The receive section of the SCAN50C400 consists of a differential input stage, a clock/data recovery PLL, a serial-to-parallel converter, and a LVDS output bus. De-emphasis at the high-speed driver outputs and a limiting amplifier circuit at the receiver inputs are used to reduce ISI distortions to enable error-free data transmission over more than 26 inches point-to-point link with a low cost FR4 backplane.

Internal low jitter PLLs are used to derive the high-speed serial clock from a differential reference clock source. Two channels share common transmit and receive LVDS clocks.

The SCAN50C400 has built-in self-test (BIST) circuitry and also loopback test modes to support at-speed self-testing.

Features

  • Quad Backplane SERDES transceiver
  • Multiple data rates at 1.25, 2.5 or 5 Gbps
  • 40 Gbps total full duplex throughput
  • Better than 10-15 bit error rate
  • Test Modes: On-chip at-speed BIST circuitry, Loopbacks
  • On-chip LVDS and CML terminations
  • High-speed CML driver with optional signal conditioning
  • 4-bit differential source synchronous LVDS parallel I/O
  • Low-jitter PLL reference to external differential HSTL clock at 125 MHz
  • Designed for use with low cost FR4 backplane
  • TIA/EIA 644-A compatible LVDS IO
  • IEEE Draft P802.3ae D4.0 - MDIO management interface protocol compatible
  • IEEE 1149.1 (JTAG) compliant test mode
  • 1.35V for core, high-speed circuitry and MDIO
  • 3.3V ±5% for LVDS IO, Control and JTAG interface
  • Low power, 4.5W (TYP)
  • 23 mm x 23 mm thermally enhanced BGA package
[Information as of 15-Jan-2004]