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SCANSTA101  Product Folder

Low Voltage IEEE 1149.1 STA Master
Generic P/N 101
General
Description
Features Datasheet Package
& Models
Samples
& Pricing
Reliability
Metrics

Parametric Table Parametric Table
Temperature Min (deg C) -40 
Temperature Max (deg C) 85 

Datasheet

TitleSize in KbytesDate
View Online

Download

Receive via Email
SCANSTA101 Low Voltage IEEE 1149.1 STA Master 403 Kbytes 31-Oct-02 View Online Download Receive via Email

If you have trouble printing or viewing PDF file(s), see Printing Problems.

Package Availability, Models, Samples & Pricing

Part NumberPackageStatusModelsSamples &
Electronic
Orders
Budgetary PricingStd
Pack
Size
Package
Marking
TypePinsMSL/Lead-Free AvailabilityLead
Time
QtySPICEIBISQty$US each
SCANSTA101SMFBGA49StatusFull productionN/Asta101sm.ibs 
Buy Now
1K+$9.00tray
of
416
NSUZXYTT
SCANSTA101
SM
6 weeks0
SCANSTA101SMXFBGA49StatusFull productionN/Asta101sm.ibs 1K+$9.00reel
of
2000
NSUZXYTT
SCANSTA101
SM
6 weeks0

General Description

The SCANSTA101 is designed to function as a test master for a IEEE 1149.1 test system. The minimal requirements to create a tester are a microcomputer (uP, RAM/ROM, clock, etc.), SCANEASE r2.0 software, and a STA101.

The SCANSTA101 is an enhanced version of, and replacement for, the SCANPSC100. The additional features of the STA101 further allow it to offload some of the processor overhead while remaining flexible. The device architecture supports IEEE 1149.1, BIST, and IEEE 1532. The flexibility will allow it to adapt to any changes that may occur in 1532 and support yet unknown variants.

The SCANSTA101 is useful in improving vector throughput when applying serial vectors to system test circuitry and reduces the software overhead that is associated with applying serial patterns with a parallel processor. The SCANSTA101 features a generic Parallel Processor Interface (PPI) which operates by serializing data from the parallel bus for shifting through the chain of 1149.1 compliant components (i.e., scan chain). Writes can be controlled either by wait states or the DTACK# line. Handshaking is accomplished with either polling or interrupts.

Features

  • Compatible with IEEE Std. 1149.1 (JTAG) Test Access Port and Boundary Scan Architecture
  • Supported by National's SCAN Ease (Embedded Application Software Enabler) Software Rev 2.0
  • Available as a Silicon Device and Intellectual Property (IP) model for embedding into VLSI devices
  • Uses generic, asynchronous processor interface; compatible with a wide range of processors and PCLK frequencies
  • 16-bit Data Interface (IP scalable to 32-bit)
  • 2Kx32 bit dual-port memory addressing for access by the PPI or the 1149.1 master
  • Load-on-the-fly (LotF) and Preload operating modes supported
  • On-Board Sequencer allows multi-vector operations such as those required to load data into an FPGA
  • On-Board Compares support TDI validation against preloaded expected data
  • 32-bit Linear Feedback Shift Register (LFSR) at the Test Data In (TDI) port
  • State, Shift, and BIST macros allow predetermined TMS sequences to be utilized
  • Operates at 3.3v supply voltages w/ 5V tolerant I/O
  • Outputs support Power-Down TRI-STATE mode.

Reliability Metrics

Part Number Process Early Failure Rate - Rejects Sample Size (EFR) PPM * Rel. Rejects Device Hours Long Term Failure Rates (FITS) MTTF
SCANSTA101SMCMOS721420014108000005226190940
SCANSTA101SMXCMOS721420014108000005226190940

For more information on Reliablitity Metrics, please click here.


[Information as of 15-Jan-2004]