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Scan Products
National also has LVDS solutions to complement the System Test Access portfolio
Introduction
The IEEE 1149.1 standard for Boundary Scan Test is the foundation of any test strategy in complex electronic systems. National Semiconductor provides innovative SCAN products that support real-world IEEE 1149 test solutions. read more
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What's New:
 
pf SCAN928028
Eight 10:1 66MHz LVDS Serializers
pf SCAN16602
Low Voltage Universal 16-bit IEEE 1149.1 Bus Transceiver
pf SCANSTA112
7 port Multidrop JTAG Multiplexer
pf SCAN926260
Six 1:10 66MHz LVDS Deserializers
 

NEW STA products A list of all the new STA products with a brief overview and links to the Product Folders and datasheets

All National JTAG Products A (mostly) complete list of all the National Products which support the IEEE 1149.1 Standard

 

Product Tree:
   

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Support Devices

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Interface Devices

 


Intro to System Test Access

Designing a Multicard Backplane
Test Access Strategy?

Read our applications brief about partitioning 1149.1 scan chains.

The STA Evaluation Kit is an easy-to-use and flexible tool for evaluating the features of the SCANSTA111 JTAG Multiplexer and our high-speed LVDS SerDes with at-speed BIST.
For more information, click here.

Software : BSDL Models 
Software : IBIS Models

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LIVE SCAN Seminars!
Seminars during the months of September and October


Online Seminars:

STA Press Releases

Interested in IEEE 1149.4,
the mixed-signal test standard?
Read about our support here.

App Notes & White Papers

Frequently Asked Questions

Other Useful Links



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