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Intro to System Test Access
Designing a Multicard Backplane Test Access Strategy? Read our applications brief about partitioning 1149.1 scan chains.

The STA Evaluation Kit is an easy-to-use and flexible tool for evaluating the features of the SCANSTA111 JTAG Multiplexer and our high-speed LVDS SerDes with at-speed BIST. For more information, click here.
Software : BSDL Models Software : IBIS Models
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LIVE SCAN Seminars! Seminars during the months of September and October
Online Seminars:
STA Press Releases
Interested in IEEE 1149.4, the mixed-signal test standard? Read about our support here.
App Notes & White Papers
Frequently Asked Questions
Other Useful Links

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